MAKANDAR, A.; JAVERIYA, S. B.; KAMAN, S. Spliced Image Forgery Detection Using Adaptive Over-Segmentation Combined With AKAZE, ORB, and SIFT Feature Descriptors. Journal of Transactions in Systems Engineering, [S. l.], v. 1, n. 3, p. 140–147, 2023. DOI: 10.15157/JTSE.2023.1.3.140-147. Disponível em: https://journals.tultech.eu/index.php/jtse/article/view/139. Acesso em: 22 nov. 2024.